【24th July】Soft matter at and beyond the limits of soft x-ray microscopy
日期：2015-07-24
閱讀：842
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TITLE: Soft matter at and beyond the limits of soft x-ray microscopy?
SPEAKER: Prof. Rainer Fink, University of Erlangen (FAU), Germany
TIME:July 24 (Friday)AM10:30?
LOCATION: 518 Meeting Room, Chemistry Building A (化學(xué)A樓518會(huì)議室)?
INVITER: Prof. Yongfeng Zhou (周永豐教授)
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Abstract: Zone-plate based soft x-ray microspectroscopy has developed into a routine technique to analysing all kind of materials. Specifically the investigation of organic materials gains from the chemical fingerprint sensitivity of near-edge x-ray absorption fine structure (NEXAFS). We will discuss various applications of the PolLux-STXM operated at the Swiss Light Source. Soft matter specimens range from polymer materials, polymer blends, organic nanocrystals and organic electronic thin film devices. Since spatial resolution in state-of-the-art zone plate-based microscopy is limited, complementary techniques are required that offer chemical insight also beyond the present STXM resolution level. Therefore, soft x-ray resonant scattering has been employed to resolve structures in the sub-10 nm regime.??
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